SYSTEM AND METHOD FOR DIAGNOSING ELECTRONIC APPARATUS

• Main Authors: TAKAOKA KAZUHIRO, FUNAKURA TERUHIKO
• Format: Patent
• Language: English
• Published: 14.03.2000
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To specify a failure point and discover the failure in its early stages by storing a current value when a normal electronic substrate carries out a reference operation, and comparing the value with a current value when an electronic substrate constituting an electronic apparatus to be inspected carries out a reference operation. SOLUTION: The diagnosing system for electronic apparatus comprising an electronic substrate where a plurality of electronic parts are mounted includes, e.g. a power source 2 for supplying a current to the electronic substrate 1, a memory 9 for storing values of the current, and the like. A substrate 1 which is confirmed not to fail makes a preliminarily set reference operation under the control from a CPU 6 and the current of the power source is stored in the memory 9. Thereafter, the power source current is measured for every substrate which is doubted to fail and compared with the value in the memory 9. The failure substrate can be judged from a change in current value. When the system is driven in a preliminarily set sequence and the power source current is stored in time sequence, since the power source current can be measured in a larger number of operation states, the failure detection rate is high.