SELF-DIAGNOSTIC METHOD FOR ELECTRONIC CIRCUIT, DIGITAL DATA PROCESSOR PROVIDED WITH SELF-DIAGNOSTIC FUNCTION, RECORD MEDIUM AND ONE-CHIP SEMICONDUCTOR INTEGRATED DEVICE

PROBLEM TO BE SOLVED: To provide a self-diagnostic method capable of shortening the required time for self-diagnosis and applicable even to a read only register. SOLUTION: In a digital data processing circuit 1 which is controlled by a central processing unit 2, a self-diagnostic program Ω is execut...

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Bibliographic Details
Main Author ONODERA YASUHIRO
Format Patent
LanguageEnglish
Published 08.02.2000
Edition7
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a self-diagnostic method capable of shortening the required time for self-diagnosis and applicable even to a read only register. SOLUTION: In a digital data processing circuit 1 which is controlled by a central processing unit 2, a self-diagnostic program Ω is executed to read default set value just after the resetting of a register 51 of a digital signal processor DSP 5, and the read value is compared with default value to self- diagnose whether or not this element operates normally.
Bibliography:Application Number: JP19980206275