CIRCUIT ARRANGEMENT FOR MEASURING DOSAGE RATE AND INTEGRATED DOSAGE OF X-RAY RADIATION BY SEMICONDUCTOR DETECTOR

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Bibliographic Details
Main Authors BLAHAK,ERNOE,HU, SZOBONYA,LASZLO,HU, PELLET,SANDOR,HU
Format Patent
LanguageEnglish
Published 29.11.1993
Edition5
Subjects
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Bibliography:Application Number: HU19900003048