METHODS AND APPARATUS FOR CLASSIFYING AN ARTIFACT IN A SPECIMEN

A model-based method of inspecting a specimen for presence of one or more artifacts (e.g., a clot, bubble, and/or foam). The method includes capturing multiple images of the specimen at multiple different exposures and at multiple spectra having different nominal wavelengths, selection of optimally-...

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Bibliographic Details
Main Authors KLUCKNER, Stefan, CHANG, Yao-jen, CHEN, Terrence, POLLACK, Benjamin, S
Format Patent
LanguageChinese
English
Published 11.10.2019
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A model-based method of inspecting a specimen for presence of one or more artifacts (e.g., a clot, bubble, and/or foam). The method includes capturing multiple images of the specimen at multiple different exposures and at multiple spectra having different nominal wavelengths, selection of optimally-exposed pixels from the captured images to generate optimally-exposed image data for each spectra, computing statistics of the optimally-exposed pixels to generate statistical data, identifying a serum or plasma portion of the specimen, and classifying, based on the statistical data, whether an artifact is present or absent within the serum or plasma portion. Testing apparatus and quality check modules adapted to carry out the method are described, as are other aspects.
Bibliography:Application Number: HK20180116347