Method for detecting the wavelenght-dependent behavior of an illuminated specimen

• Main Authors: MOEHLER GUNTER, WOLLESCHENSKY RALF
• Format: Patent
• Language: English
• Published: 02.04.2004
• Subjects: APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]; COLORIMETRY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS; OPTICS; PHYSICS; RADIATION PYROMETRY; SCANNING-PROBE TECHNIQUES OR APPARATUS; TESTING

The invention relates to a method and to an assembly for operating an optical imaging system for detecting the characteristic values of the wavelength-dependent behavior of an illuminated specimen, especially of the emission and/or absorption behavior, preferably of the fluorescence and/or luminescence and/or phosphorescence and/or enzyme-activated light emission and/or enzyme-activated fluorescence, preferably for the purpose of operating a laser scanning microscope. According to the inventive method, the image spot information of the specimen is broken down into its spectral components in a spatially resolved and wavelength-independent manner on the detector end, and for different spectral components at least one summation is made.