Improvements in ion sources, and in particular in the ion extracting means thereof

882,367. Ion sources. COMMISSARIAT A L'ENERGIE ATOMIQUE. June 3, 1959 [June 4, 1958], No. 19016/59. Class 39(1) An ion source for particle accelerators or mass spectrometers or separators comprises an ionization chamber 2 at the end of a quartz or "Pyrex" (Registered Trade Mark) tube...

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Bibliographic Details
Main Author KLEIN SIEGFRIED
Format Patent
LanguageEnglish
Published 15.11.1961
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Summary:882,367. Ion sources. COMMISSARIAT A L'ENERGIE ATOMIQUE. June 3, 1959 [June 4, 1958], No. 19016/59. Class 39(1) An ion source for particle accelerators or mass spectrometers or separators comprises an ionization chamber 2 at the end of a quartz or "Pyrex" (Registered Trade Mark) tube 1 through which a gas or vapour is supplied and an extraction electrode 51a which surrounds a short extension 24 of the ionization chamber. The ionization chamber is formed by an enlarged portion of the tube 1. The gas or vapour is fed to the tube 1 through a hollow electrode 5 and a high potential difference is maintained between the electrode 5 and the extractionelectrode 51a. A quartz disc 30 increases the disruptive voltage of the ion source. Ionization is effected across a gap in the inner conductor of a coaxial line resonator R at the position of ionization chamber 2. The ions emerging from the tube are accelerated by a cup-shaped electrode 52a which passes only the central portion of the beam and collects the remainder. The source may be used for the ionization of gases, such as hydrogen, deuterium, helium and nitrogen, or of vapours, such as lithium and sodium. The vacuum may be maintained at 10-3 to 10-4 mm. Hg. Specification 882,366 is referred to.
Bibliography:Application Number: GB19590019016