A metrology and inspection system

An automated and intelligent Metrology and Inspection system 1 comprising a rigid base platform 2, at least one detachably mounted multi-axis object clamping unit 4, at least one detachably mounted multi-axis arm positioning unit comprising a measurement and inspection subsystem 5 and a system contr...

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Bibliographic Details
Main Authors John Milroy, Michael Nugent, Andrew Hodson
Format Patent
LanguageEnglish
Published 01.05.2024
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An automated and intelligent Metrology and Inspection system 1 comprising a rigid base platform 2, at least one detachably mounted multi-axis object clamping unit 4, at least one detachably mounted multi-axis arm positioning unit comprising a measurement and inspection subsystem 5 and a system controller. In addition, a method of measuring and inspecting an object comprising clamping the object to be measured, positioning the object to present a region of interest to a plurality of sensors, positioning at least one of the sensors to measure an attribute in a region of interest, positioning another sensor to measure an attribute in a region of interest, gathering and collating the measurement data from the sensors and communicating the data to a system controller. The system may comprise an in-built verification module for self-calibrating the system using traceable artifacts.
Bibliography:Application Number: GB20220015696