X-ray inspection system and control architecture for an X-ray inspection system
In one embodiment it is disclosed an x-ray inspection system including: a plurality of detector elements for detecting x-rays, the detector elements being positioned to detect x-rays from an inspection area; a control logic module, separate from the detector elements, the control logic module being...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
19.06.2024
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Subjects | |
Online Access | Get full text |
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Summary: | In one embodiment it is disclosed an x-ray inspection system including: a plurality of detector elements for detecting x-rays, the detector elements being positioned to detect x-rays from an inspection area; a control logic module, separate from the detector elements, the control logic module being configured to control operation of the detector elements and an x-ray source for the acquisition of x-ray inspection data, and to synchronise operation of the detector elements with operation of the x-ray source. |
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Bibliography: | Application Number: GB20210009203 |