X-ray inspection system and control architecture for an X-ray inspection system

In one embodiment it is disclosed an x-ray inspection system including: a plurality of detector elements for detecting x-rays, the detector elements being positioned to detect x-rays from an inspection area; a control logic module, separate from the detector elements, the control logic module being...

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Bibliographic Details
Main Authors Jean-Michel Faugier, Thibaut Berthellier
Format Patent
LanguageEnglish
Published 19.06.2024
Subjects
DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Summary:In one embodiment it is disclosed an x-ray inspection system including: a plurality of detector elements for detecting x-rays, the detector elements being positioned to detect x-rays from an inspection area; a control logic module, separate from the detector elements, the control logic module being configured to control operation of the detector elements and an x-ray source for the acquisition of x-ray inspection data, and to synchronise operation of the detector elements with operation of the x-ray source.
Bibliography:Application Number: GB20210009203