Diagnostic testing method for a spectrometer

A spectrometer comprising a source of line spectra, e.g. a plasma source such as inductively coupled plasma (ICP), is configured to emit at least one branched pair of spectral lines from an excited species. The spectrometer has e.g. a CCD, CMOS or CID detector. A plurality of detector diagnostic mea...

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Bibliographic Details
Main Authors Ayrat Murtazin, Sebastian Geisler
Format Patent
LanguageEnglish
Published 25.05.2022
Subjects
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:A spectrometer comprising a source of line spectra, e.g. a plasma source such as inductively coupled plasma (ICP), is configured to emit at least one branched pair of spectral lines from an excited species. The spectrometer has e.g. a CCD, CMOS or CID detector. A plurality of detector diagnostic measurements is performed, each comprising measuring an intensity of both a first and second spectral line of the branched pair, possibly simultaneously so that flicker noise is correlated. The spectrometer is controlled in order to vary the intensity of the spectral lines incident on the detector, for example by varying the power between 800-1600W. The detector operating condition is diagnosed based on the constancy of the ratios of intensities of first and second spectral lines. Where the measured intensities do not form a linear relationship or are scattered extensively, the detector may be diagnosed to be exhibiting an irregular operating condition.
Bibliography:Application Number: GB20200018380