Test system for anti-DC component and even-order harmonic of current transformer

• Main Authors: Da Cheng, Xiangyu Yuan, Erwei Shi, Penghe Zhang, Yatao Wang, Chen Tan, Chenglin Qin, Yinghui Xu, Yue Zhao, Chuning Peng, Yang Xue, Bing Zhao
• Format: Patent
• Language: English
• Published: 30.05.2018
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A test system for an anti-DC component and an even-order harmonic of a current transformer. The test system comprises a big current generator, a standard current transformer (8), a half-wave rectification apparatus, an impedance matching apparatus, and a half-wave transformer calibrator (9). A primary side of the testing system comprises a first half-wave rectification apparatus (1), a second half-wave rectification apparatus (2), and a first impedance matching apparatus (5), the first half-wave rectification apparatus (1) and the first impedance matching apparatus (5) in series connection being connected in parallel to the second half-wave rectification apparatus (2) and a tested current transformer (7) that are also connected in series. A secondary side of the test system comprises a third half-wave rectification apparatus (3), a fourth half-wave rectification apparatus (4), and a second impedance matching apparatus (6), the fourth half-wave rectification apparatus (4), the second impedance matching apparatus (6), and a standard current transformer (8) being connected in series to the third half-wave rectification apparatus (3), and the big current generator being connected to the standard current transformer (8).