Adapting the usage configuration of integrated circuit input-output pads

Techniques for implementing a self-test procedure of an integrated circuit are provided, where the self-test procedure comprises testing for an electrical connection between first and second input-output pads of the integrated circuit. A control device is capable of adapting a functional configurati...

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Bibliographic Details
Main Authors James Edward Myers, Parameshwarappa Anand Kumar Savanth
Format Patent
LanguageEnglish
Published 25.08.2021
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:Techniques for implementing a self-test procedure of an integrated circuit are provided, where the self-test procedure comprises testing for an electrical connection between first and second input-output pads of the integrated circuit. A control device is capable of adapting a functional configuration of usage of the first and second input-output pads in dependence on presence of the electrical connection. A corresponding integrated circuit, printed circuit and method are also provided. These techniques allow the integrated circuit to be used in a variety of contexts, without requiring physical customisation of the integrated circuit to adapt it to its usage context, in particular where connections from the context to the pads of the integrated circuit may be made to individual pads in some contexts or may span more than one pad in other contexts.
Bibliography:Application Number: GB20150000414