Method and system for tandem mass spectrometry

• Main Author: Anatoly N Verenchikov
• Format: Patent
• Language: English
• Published: 19.02.2020
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS; ELECTRICITY

A method of data independent MS-MS analysis is disclosed. The method comprises ramping or stepping in small steps of a wide (at least 10 amu) parent mass window in a first parent selecting mass spectrometer (MS1), arranging rapid ion transfer through a collisional cell, either by axial gas flow or by an axial DC field or by a travelling RF wave, frequently pulsing an orthogonal accelerator with a string of time-encoded pulses, analyzing fragment ions in a multi-reflecting time-flight mass spectrometer, acquiring data in a data logging format, and decoding signal strings corresponding to the entire scan of parent masses, such that fragment spectra are formed based on time correlation between fragment and parent masses. Frequent pulsing is expected to recover parent and fragment time correlation with an accuracy of approximately 1 Th, in spite of using much wider mass window in the first MS.