Tandem time-of-flight mass spectrometry with non-uniform sampling

A method and apparatus are disclosed for parallel all-mass tandem mass spectrometry employing multi-reflecting time-of-flight analyzer for both MS stages, preferably arranged within the same analyzer to secure ultra-high resolution. Sensitivity and speed of TOF-TOF tandem are enhanced by non-redunda...

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Bibliographic Details
Main Authors Anatoly N Verenchikov, Vasily Makarov
Format Patent
LanguageEnglish
Published 28.02.2018
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
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Summary:A method and apparatus are disclosed for parallel all-mass tandem mass spectrometry employing multi-reflecting time-of-flight analyzer for both MS stages, preferably arranged within the same analyzer to secure ultra-high resolution. Sensitivity and speed of TOF-TOF tandem are enhanced by non-redundant multiplexing based on signal sparseness and on avoiding repetitive signal overlaps at multiple repetitions of true fragment signals. Non-redundant matrices of gate and delay timing are constructed by extending orthogonal Latin square matrices. The method is generalized for multiplexing of any multiple repetitive signal sources being sparse either spectrally, or spatially, or in time.
Bibliography:Application Number: GB20150000018