Apparatus and method for monitoring a sedimentation parameter in a fluid medium sample

There is provided a method of measuring a sedimentation parameter of suspensions or precipitants in a fluid medium sample, said method compromising providing at least one micro-cantilever sensor, said micro-cantilever sensor comprising at least two materials having different coefficients of thermal...

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Bibliographic Details
Main Authors VLADISLAV DJAKOV, LOIS BELLO FERNANDEZ DE SANMAMED, ROBERT HENRY IBBOTSON, RICHARD JOHN DUNN
Format Patent
LanguageEnglish
Published 29.10.2014
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:There is provided a method of measuring a sedimentation parameter of suspensions or precipitants in a fluid medium sample, said method compromising providing at least one micro-cantilever sensor, said micro-cantilever sensor comprising at least two materials having different coefficients of thermal expansion, and having a heater and piezo-resistive sensor integrated therein, pulsing the heater with one or more electrical pulses to induce heat generation in the micro-cantilever, sampling the output of the integrated piezo-resistive sensor to characterize a response of the micro-cantilever during sedimentation in the fluid medium sample, and determining a value of the sedimentation parameter from the characterized response. There is also provided an apparatus arranged to carry out the method.
Bibliography:Application Number: GB20120021432