Optical emission eystem including dichroic beam combiner

An optical emission spectrometer system 100 (200,fig 3) includes a light source 101 and a dichroic beam combiner 130. The light source emits first light 115 in a first direction and second light 125 in a second direction different from the first direction. The dichroic beam combiner receives the fir...

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Bibliographic Details
Main Authors LINDSAY BUCK, GLYN RUSSELL, MICHAEL BOLLES, YIN SHENG SUN
Format Patent
LanguageEnglish
Published 06.11.2013
Subjects
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:An optical emission spectrometer system 100 (200,fig 3) includes a light source 101 and a dichroic beam combiner 130. The light source emits first light 115 in a first direction and second light 125 in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path 110 and the second light via a second light path 120, reflects a portion the first light into an entrance aperture 145 of a light detection and measurement apparatus 140, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.
Bibliography:Application Number: GB20130003761