Thickness measurement device
Thickness measuring apparatus for accurately measuring the thickness of a flat object such as a sheet material. The apparatus includes a radiation type measuring device (15), e.g. a laser type device which can measure the distance to a first surface of the oblect and an eddy current type device (16)...
Saved in:
| Main Author | |
|---|---|
| Format | Patent |
| Language | English |
| Published |
01.11.1989
|
| Subjects | |
| Online Access | Get full text |
Cover
Loading…
| Abstract | Thickness measuring apparatus for accurately measuring the thickness of a flat object such as a sheet material. The apparatus includes a radiation type measuring device (15), e.g. a laser type device which can measure the distance to a first surface of the oblect and an eddy current type device (16) which can measure distance to the other surface of the object. The thickness is obtained by subtracting the two distances. The eddy current type device has an open central region so that the radiation type device can be located generally coaxially with it. This arrangement minimises errors when the apparatus is moved relative to the object. |
|---|---|
| AbstractList | Thickness measuring apparatus for accurately measuring the thickness of a flat object such as a sheet material. The apparatus includes a radiation type measuring device (15), e.g. a laser type device which can measure the distance to a first surface of the oblect and an eddy current type device (16) which can measure distance to the other surface of the object. The thickness is obtained by subtracting the two distances. The eddy current type device has an open central region so that the radiation type device can be located generally coaxially with it. This arrangement minimises errors when the apparatus is moved relative to the object. |
| Author | MICHAEL WILLIAM KING |
| Author_xml | – fullname: MICHAEL WILLIAM KING |
| BookMark | eNrjYmDJy89L5WSQCcnITM7OSy0uVshNTSwuLUrNTc0rUUhJLctMTuVhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHuTkZGhuYWxqaOxoRVAAD_jyTn |
| ContentType | Patent |
| DBID | EVB |
| DatabaseName | esp@cenet |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Medicine Chemistry Sciences Physics |
| ExternalDocumentID | GB2217835A |
| GroupedDBID | EVB |
| ID | FETCH-epo_espacenet_GB2217835A3 |
| IEDL.DBID | EVB |
| IngestDate | Fri Jul 19 12:39:58 EDT 2024 |
| IsOpenAccess | true |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-epo_espacenet_GB2217835A3 |
| Notes | Application Number: GB19890007850 |
| OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19891101&DB=EPODOC&CC=GB&NR=2217835A |
| ParticipantIDs | epo_espacenet_GB2217835A |
| PublicationCentury | 1900 |
| PublicationDate | 19891101 |
| PublicationDateYYYYMMDD | 1989-11-01 |
| PublicationDate_xml | – month: 11 year: 1989 text: 19891101 day: 01 |
| PublicationDecade | 1980 |
| PublicationYear | 1989 |
| RelatedCompanies | KINERON GAUGING SYSTEMS LTD |
| RelatedCompanies_xml | – name: KINERON GAUGING SYSTEMS LTD |
| Score | 2.3945255 |
| Snippet | Thickness measuring apparatus for accurately measuring the thickness of a flat object such as a sheet material. The apparatus includes a radiation type... |
| SourceID | epo |
| SourceType | Open Access Repository |
| SubjectTerms | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| Title | Thickness measurement device |
| URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19891101&DB=EPODOC&locale=&CC=GB&NR=2217835A |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwdV1LS8NAEB5qfd40KlWr5iC5LeaxScwhiHm1CH0gUXoru8mGFrEWE_HvO1kS66XXWZh9wDfz7ezMLMCdx3I9tyknFuWU0MIyyIPjuQS5si5canMqm_qMxs7wlT7P7FkHFm0tjOwT-iObIyKiMsR7Je31ehPEimRuZXnPlyj6fExSP9Jy1qT_oDcztCjw4-kkmoRaGPqDQBu_-CZSbyQbTzuwiyTarbEQvwV1Tcr6v0NJjmFvirpW1Ql0xEqBw7D9d02Bg1Hz3K3AvszPzEoUNhgsT6GfLpbZe22h1I9NgE_NRY35M7hN4jQcEpxw_re3-SBoV2adQxdv_KIHala4SItYZjrMo0homI6-hhfCE4UwTGFfQG-blsvtQ1dwJBOkZCFdH7rV17e4Ro9a8Rt5GL-fG3mL |
| link.rule.ids | 230,309,783,888,25576,76876 |
| linkProvider | European Patent Office |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwdV1LT4NAEJ7U-qg3RU3VajkYbkQeC8iBGHkVtdDGoOmt4bGkjbE2gvHvO2zAeul1Npl9JN_Mt7MzswA3ZpJLuUZSUSUpEUmhyuKdbhoicmWJGkRLCWvqE0Z68EqeZtqsA4u2Fob1Cf1hzRERURnivWL2er0JYrkst7K8TZco-rz3Y8sV8qRJ_0FvJguubXnTiTtxBMexRrYQvVgKUm8kGw87sIsE26ix4L3ZdU3K-r9D8Y9gb4q6VtUxdOiKg57T_rvGwUHYPHdzsM_yM7MShQ0GyxMYxItl9l5bKP5jE-Djc1pj_hSGvhc7gYgTzv_2Nh_Z7crUM-jijZ_2gc8KA2lRkil6YhIkNImEviYtqEkLKitUO4f-Ni0X24eG0AvicDwfP0bPl3DIkqVYUd0AutXXN71C71ql1-xgfgF8VHx- |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Thickness+measurement+device&rft.inventor=MICHAEL+WILLIAM+KING&rft.date=1989-11-01&rft.externalDBID=A&rft.externalDocID=GB2217835A |