Thickness measurement device

Thickness measuring apparatus for accurately measuring the thickness of a flat object such as a sheet material. The apparatus includes a radiation type measuring device (15), e.g. a laser type device which can measure the distance to a first surface of the oblect and an eddy current type device (16)...

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Bibliographic Details
Main Author MICHAEL WILLIAM KING
Format Patent
LanguageEnglish
Published 01.11.1989
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:Thickness measuring apparatus for accurately measuring the thickness of a flat object such as a sheet material. The apparatus includes a radiation type measuring device (15), e.g. a laser type device which can measure the distance to a first surface of the oblect and an eddy current type device (16) which can measure distance to the other surface of the object. The thickness is obtained by subtracting the two distances. The eddy current type device has an open central region so that the radiation type device can be located generally coaxially with it. This arrangement minimises errors when the apparatus is moved relative to the object.
Bibliography:Application Number: GB19890007850