VOLTAGE MARGINING CIRCUIT FOR FLASH EPROM
A circuit is described for providing internal voltage margining for a flash EPROM to verify erasing and programming. Matched transistors are used to develop the internal margined voltage so as to provide a potential which is substantially independent of process variations. Different potentials are u...
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Main Author | |
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Format | Patent |
Language | English |
Published |
31.08.1989
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Subjects | |
Online Access | Get full text |
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Summary: | A circuit is described for providing internal voltage margining for a flash EPROM to verify erasing and programming. Matched transistors are used to develop the internal margined voltage so as to provide a potential which is substantially independent of process variations. Different potentials are used to verify programming and erasing. |
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Bibliography: | Application Number: GB19880019691 |