STRUCTURE D'ENCAPSULATION HERMETIQUE D'UN DISPOSITIF ET D'UN COMPOSANT ELECTRONIQUE
The structure (100) has a hermetically sealed cavity (110) for encapsulating a device (106), a complementary metal oxide semiconductor (CMOS) transistor produced on a substrate (102), and a getter material layer (108) covering the CMOS transistor. The device is selected from one of a microelectromec...
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Main Authors | , |
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Format | Patent |
Language | French |
Published |
10.10.2014
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Subjects | |
Online Access | Get full text |
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Summary: | The structure (100) has a hermetically sealed cavity (110) for encapsulating a device (106), a complementary metal oxide semiconductor (CMOS) transistor produced on a substrate (102), and a getter material layer (108) covering the CMOS transistor. The device is selected from one of a microelectromechanical system (MEMS) device, a nanoelectromechanical system (NEMS device), a micro-opto electromechanical system (MOEMS) device, and a nano-opto electromechanical system (NOEMS) device, and an infrared sensor. A dielectric layer (111) is placed between the transistor and the getter material layer. An independent claim is also included for a method for encapsulating the device and the electronic component in the cavity. |
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Bibliography: | Application Number: FR20110059848 |