PROCEDE ET SYSTEME POUR LA CLASSIFICATION ET LE DIAGNOSTIC HIERARCHISES D'ANOMALIES DANS DE GRANDS SYSTEMES

• Main Authors: OSBORN MARK DAVID, YU LIJIE, CLEARY DANIEL JOSEPH
• Format: Patent
• Language: French
• Published: 15.04.2011
• Subjects: CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MEASURING; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; REGULATING; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

A method for diagnosing and classifying faults in a system is provided. The method comprises acquiring operational data for at least one of a system, one or more subsystems of the system or one or more components of the one or more subsystems. Then, the method comprises analyzing the operational data using one or more diagnostic models. Each diagnostic model uses the operational data to determine a probability of fault associated with at least one of the one or more components or the one or more subsystems. Finally, the method comprises deriving an overall probability of fault for at least one of the system, the one or more subsystems, or the one or more components using the one or more probabilities of fault determined by the one or more diagnostic models and one or more hierarchical relationships between the subsystems and components of the system.