SISTEMA Y METODO DE DETECCION DE DEFECTOS EN SUPERFICIES ESPECULARES O SEMI-ESPECULARES MEDIANTE PROYECCION FOTOGRAMETRICA

The present invention relates to a system for defecting defects in specular or semi-specular surfaces of objects to be inspected, which is suitable for integration into an industrial production line and comprises: a plurality of light-emission means (1) for emitting light onto the objects; a plurali...

Full description

Saved in:
Bibliographic Details
Main Authors SAMPER CARNICER, David, VELAZQUEZ SANCHO, Jesús, SANTOLARIA MAZO, Jorge, AGUILAR MARTIN, Juan José
Format Patent
LanguageSpanish
Published 04.07.2018
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:The present invention relates to a system for defecting defects in specular or semi-specular surfaces of objects to be inspected, which is suitable for integration into an industrial production line and comprises: a plurality of light-emission means (1) for emitting light onto the objects; a plurality of cameras (2) for detecting the light reflected by the objects; a subsystem for control and photogrammetric analysis of information associated with the light emitted by the light-emission means (1) and with the light detected by the cameras (2); and a supporting structure (3) integrated into the production line of the objects to be inspected, the light-emission means (1) and the cameras (2) of the system being disposed on the structure. Advantageously, the light-emission means (1) are disposed in the system such that the light emitted onto the surface of the objects has a periodic pattern of light and shade, and the pattern is emitted with relative movement on the objects to be inspected, passing across the surface thereof.
Bibliography:Application Number: ES20150031776