System of signaling of defects in flat glass applied to a line of detection of defects of artificial vision. (Machine-translation by Google Translate, not legally binding)

Flat glass flaw signaling system applied to an artificial vision defect detection line, with bearing devices (4) on which the glass sheet (6) rests to be transported through a washing machine (1) of glass and through an artificial vision scanner (2) connected to a computer (3), which detects the exi...

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Bibliographic Details
Main Authors MOR ABAD, FRANCISCO, LARREA ARANGUREN, LANDER, MARTINEZ PINEDO, JUAN CARLOS
Format Patent
LanguageEnglish
Spanish
Published 17.10.2012
Subjects
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Summary:Flat glass flaw signaling system applied to an artificial vision defect detection line, with bearing devices (4) on which the glass sheet (6) rests to be transported through a washing machine (1) of glass and through an artificial vision scanner (2) connected to a computer (3), which detects the existence or not of defects indicating in the computer (3) the approximate position of said defects, comprising a surface (5) arranged following the scanner (2) of dimension at least equal to the surface of the sheet (6) to be analyzed, with a plurality of independent lighting devices (7), so that the defects of the sheet (6), in addition to be indicated in the computer image, are indicated by at least one of said lighting devices (7) directly on the sheet itself (6). (Machine-translation by Google Translate, not legally binding) Sistema de señalización de defectos en vidrio laminado aplicado a una línea de detección de defectos de visión artificial, con dispositivos de rodamiento (4) sobre los que apoya la lámina (6) de vidrio para ser transportada a través de una lavadora (1) de vidrio y a través de un escáner (2) de visión artificial conectado a un ordenador (3), que detecta la existencia o no de defectos indicando en el ordenador (3) la posición aproximada de dichos defectos, que comprende una superficie (5) dispuesta a continuación del escáner (2) de dimensión al menos igual a la superficie de la lámina (6) a analizar, con una pluralidad de dispositivos de iluminación (7) independientes, de modo que los defectos de la lámina (6), además de quedar indicados en la imagen del ordenador, quedan señalados por al menos uno de dichos dispositivos de iluminación (7) de manera directa sobre la propia lámina (6).
Bibliography:Application Number: ES20100030605