METODO PARA OBTENER IMAGENES MULTIESPECTRALES DE REFLECTANCIA ABSOLUTA

A method is described for carrying out quantitative measurements in different bands of interest by means of a modified reflection (20) (or transmitted light) optical microscope. Said measurements are carried out in an automated way thanks to the intervention of a control unit (30) that is coupled wi...

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Bibliographic Details
Main Authors BREA, CAROLINA BEATRIZ, CASTROVIEJO BOLIBAR, RICARDO, PEREZ BARNUEVO, LAURA, CATALINA HERNANDEZ, JUAN CARLOS, SEGUNDO GARCIA, FERNANDO, ESPI RODRIGUEZ, JOSE ANTONIO
Format Patent
LanguageSpanish
Published 07.06.2013
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Summary:A method is described for carrying out quantitative measurements in different bands of interest by means of a modified reflection (20) (or transmitted light) optical microscope. Said measurements are carried out in an automated way thanks to the intervention of a control unit (30) that is coupled with the modified microscope to assist in the calibration of the device. Additionally, it also performs corrections of the images taken according to the band of interest so that each gray level is associated with a real reflectance level of the sample (or transmittance) for which the image has been taken. (Machine-translation by Google Translate, not legally binding)
Bibliography:Application Number: ES20110030499