ACCURATE AND FAST POWER MODULE TEMPERATURE ASSESSMENT

Systems and methods for accurate and fast measurement of junction temperature for power modules are provided. Such systems and methods include a one or more power transistors (108) that each have a respective die surface over which is positioned and electrically coupled to a conductive overlay (102)...

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Main Authors YANG, Liqiang, LEE, Shung Ik, GRIMES, Darrell, CHO, Hyunmin
Format Patent
LanguageEnglish
French
German
Published 03.04.2024
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Abstract Systems and methods for accurate and fast measurement of junction temperature for power modules are provided. Such systems and methods include a one or more power transistors (108) that each have a respective die surface over which is positioned and electrically coupled to a conductive overlay (102). A temperature sensor is physically bonded to a top surface of the conductive overlay (102) to provide a direct temperature measurement for the one or more power transistors (108).
AbstractList Systems and methods for accurate and fast measurement of junction temperature for power modules are provided. Such systems and methods include a one or more power transistors (108) that each have a respective die surface over which is positioned and electrically coupled to a conductive overlay (102). A temperature sensor is physically bonded to a top surface of the conductive overlay (102) to provide a direct temperature measurement for the one or more power transistors (108).
Author GRIMES, Darrell
CHO, Hyunmin
YANG, Liqiang
LEE, Shung Ik
Author_xml – fullname: YANG, Liqiang
– fullname: LEE, Shung Ik
– fullname: GRIMES, Darrell
– fullname: CHO, Hyunmin
BookMark eNrjYmDJy89L5WQwdXR2Dg1yDHFVcPRzUXBzDA5RCPAPdw1S8PV3CfVxVQhx9Q1wBcqHBgFVBAe7Bgf7uvqF8DCwpiXmFKfyQmluBgU31xBnD93Ugvz41OKCxOTUvNSSeNcAE2MTUxNjI0dDYyKUAACm0Skk
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate GENAUE UND SCHNELLE BEURTEILUNG DER LEISTUNGSMODULTEMPERATUR
ÉVALUATION PRÉCISE ET RAPIDE DE LA TEMPÉRATURE D'UN MODULE DE PUISSANCE
ExternalDocumentID EP4345432A1
GroupedDBID EVB
ID FETCH-epo_espacenet_EP4345432A13
IEDL.DBID EVB
IngestDate Fri Sep 06 06:22:15 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
French
German
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_EP4345432A13
Notes Application Number: EP20230196916
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240403&DB=EPODOC&CC=EP&NR=4345432A1
ParticipantIDs epo_espacenet_EP4345432A1
PublicationCentury 2000
PublicationDate 20240403
PublicationDateYYYYMMDD 2024-04-03
PublicationDate_xml – month: 04
  year: 2024
  text: 20240403
  day: 03
PublicationDecade 2020
PublicationYear 2024
RelatedCompanies GE Aviation Systems LLC
RelatedCompanies_xml – name: GE Aviation Systems LLC
Score 3.5291815
Snippet Systems and methods for accurate and fast measurement of junction temperature for power modules are provided. Such systems and methods include a one or more...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
Title ACCURATE AND FAST POWER MODULE TEMPERATURE ASSESSMENT
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240403&DB=EPODOC&locale=&CC=EP&NR=4345432A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV07a8MwED5C-tzatKXpCw3FW6ix5BgPoTiyTCj1A8dpswVb0ZDFCbVL_35PIkm7tJs4wSEJPp0-6bsTwKP0h9Jd-ggkqZCgLH06KJGEDbzKripVKqcc6kThOBlOZuxl7s47sNrlwpg6oV-mOCIiSiLeW7Nfb34usUKjrWyeqhWa1s9RMQqtLTvG8MRsaoXjkcjSMOUW59iyknzEKHMZdQIkSgd4ivY0GMTbWCelbH5HlOgMDjN0Vrfn0FF1D0747uO1HhzH2_fuHhwZgaZs0LgFYXMBbsD5LA8KQYIkJFEwLUiWvoucxGk4exWkEHEmcqNnIMFU75e6YP8lkEgUfDLAkSz2s16IbD9megXdel2rayDSVcwrnVLzGMSe49sMCQeeG2xFpb9Ufej_6ebmn75bONXLZzQp9A667cenusdw21YPZqG-ATpIfok
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV07T8MwED5VvMoGBUR5ekDZKqLYaZWhQqnjqEDzUJpCtypxPXRJKxrE3-dstYUFNussnWxLn8-f_d0Z4EF6XenOPQSSVEhQ5h7tFEjCOr3SLktVKKfo6kThKO4OJ-xl6k4bsNjmwpg6oV-mOCIiSiLea7Nfr34usQKjrVw_lgs0LZ_CvB9YG3aM4YnZ1AoGfZEmQcItzrFlxVmfUeYy6vhIlPbxhN3TYBBvA52UsvodUcITOEjRWVWfQkNVLWjy7cdrLTiKNu_dLTg0Ak25RuMGhOszcH3OJ5mfC-LHAQn9cU7S5F1kJEqCyUiQXESpyIyegfhjvV_qgv3nQEKR82EHRzLbzXom0t2Y6QXsVctKXQKRrmK9wik0j0HsOZ7NkHDgucFWVHpz1Yb2n26u_um7h-Ywj0az0XP8eg3HeimNPoXewF798aluMfTW5Z1ZtG9VGYF8
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=ACCURATE+AND+FAST+POWER+MODULE+TEMPERATURE+ASSESSMENT&rft.inventor=YANG%2C+Liqiang&rft.inventor=LEE%2C+Shung+Ik&rft.inventor=GRIMES%2C+Darrell&rft.inventor=CHO%2C+Hyunmin&rft.date=2024-04-03&rft.externalDBID=A1&rft.externalDocID=EP4345432A1