SYSTEM FOR MONITORING CONDITIONS AT A LOCATION

A system for monitoring conditions at a location, such as a roof of a building comprises a superstructure, a power supply, a sensor array, and a central processor. The sensor array may comprise a plurality of data sensors. Each data sensor may be physically connected to the superstructure, and elect...

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Bibliographic Details
Main Author COBB, Joseph C
Format Patent
LanguageEnglish
French
German
Published 17.01.2024
Subjects
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
CALCULATING
COMPUTING
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
COUNTING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
METEOROLOGY
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
TARIFF METERING APPARATUS
TESTING
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Summary:A system for monitoring conditions at a location, such as a roof of a building comprises a superstructure, a power supply, a sensor array, and a central processor. The sensor array may comprise a plurality of data sensors. Each data sensor may be physically connected to the superstructure, and electrically connected to the power supply. The central processor may be configured to receive a plurality of inputs from the plurality of data sensors and communicate the plurality of inputs to a receiver.
Bibliography:Application Number: EP20220746781