COMPOSITION AND PROCESS FOR SELECTIVELY ETCHING A HARD MASK AND/OR AN ETCH-STOP LAYER IN THE PRESENCE OF LAYERS OF LOW-K MATERIALS, COPPER, COBALT AND/OR TUNGSTEN

• Main Authors: Klipp, Andreas, Wang, Che Wei, Hoogboom, Joannes Theodorus Valentinus, Ke, Jhih Jheng, Ting, Chia Ching
• Format: Patent
• Language: English; French; German
• Published: 20.12.2023
• Subjects: ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES; BASIC ELECTRIC ELEMENTS; CANDLES; CHEMISTRY; DETERGENT COMPOSITIONS; DETERGENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; FATTY ACIDS THEREFROM; METALLURGY; RECOVERY OF GLYCEROL; RESIN SOAPS; SEMICONDUCTOR DEVICES; SOAP OR SOAP-MAKING; USE OF SINGLE SUBSTANCES AS DETERGENTS

The use of a cleaning composition in combination with one or more oxidants is described for removing post-etch or post-ash residue from the surface of a semiconductor substrate and/or for oxidative etching or partially oxidative etching of a layer or mask comprising or consisting of a material selected from the group consisting of TiN, Ta, TaN, Al and HfOx and/or a layer or mask comprising or consisting of a material selected from the group consisting of tungsten carbide (WCx) and tungsten nitride (WNx), and/or for removing from the surface of a semiconductor substrate a layer comprising an aluminium compound. Further is described said cleaning composition and a use of said cleaning composition for removing post-etch or post-ash residue from the surface of a semiconductor substrate. Under a further aspect, it is described a wet-etch composition comprising said cleaning composition and one or more oxidants as well as the use of said wet-etch composition. A process for the manufacture of a semiconductor device from a semiconductor substrate and a kit comprising said cleaning composition and one or more oxidants are also described.