CONTINUOUS INFRARED SPECTROSCOPY SYSTEM AND METHOD

A sample support apparatus (150) for use in a spectrometer (285), comprises an elongate support (110) comprising a plurality of receiving portions (112) each configured to receive a respective internal reflection element (IRE) or IRE slide (135), the elongate support having a sample side and a beam...

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Bibliographic Details
Main Authors BUTLER, Holly Jean, HEGARTY, Mark, BAKER, Matthew J
Format Patent
LanguageEnglish
French
German
Published 23.08.2023
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A sample support apparatus (150) for use in a spectrometer (285), comprises an elongate support (110) comprising a plurality of receiving portions (112) each configured to receive a respective internal reflection element (IRE) or IRE slide (135), the elongate support having a sample side and a beam side opposite the sample side; and a plurality of IREs or IRE slides (135), each IRE or IRE slide provided at a respective receiving portion (112) of the elongate support (110), wherein each IRE or IRE slide (135) has at least one sample-receiving portion provided on a sample side thereof, and at least one beam-receiving portion provided on a beam side thereof. The sample support apparatus (150) has a stowed configuration, and a deployed configuration configured to allow application of a sample (276) on one or more of the plurality of IREs or IRE slides (135).
Bibliography:Application Number: EP20210798762