POST CMP CLEANING COMPOSITIONS

In general, the invention provides high pH cleaning compositions for dielectric surfaces such as PETEOS, SiO2, thermal oxide, silicon nitride, silicon, etc. The compositions of the invention afford superior surface wetting, dispersion of particles and organic residues, and prevents redeposition and...

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Bibliographic Details
Main Authors WHITE, Daniela, KIM, YoungMin, WHITE, Michael, L
Format Patent
LanguageEnglish
French
German
Published 16.08.2023
Subjects
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Summary:In general, the invention provides high pH cleaning compositions for dielectric surfaces such as PETEOS, SiO2, thermal oxide, silicon nitride, silicon, etc. The compositions of the invention afford superior surface wetting, dispersion of particles and organic residues, and prevents redeposition and re-agglomeration of the dispersed residue during cleaning to afford superior cleaning and low defectivity.
Bibliography:Application Number: EP20210878273