POST CMP CLEANING COMPOSITIONS
In general, the invention provides high pH cleaning compositions for dielectric surfaces such as PETEOS, SiO2, thermal oxide, silicon nitride, silicon, etc. The compositions of the invention afford superior surface wetting, dispersion of particles and organic residues, and prevents redeposition and...
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Main Authors | , , |
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Format | Patent |
Language | English French German |
Published |
16.08.2023
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Subjects | |
Online Access | Get full text |
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Summary: | In general, the invention provides high pH cleaning compositions for dielectric surfaces such as PETEOS, SiO2, thermal oxide, silicon nitride, silicon, etc. The compositions of the invention afford superior surface wetting, dispersion of particles and organic residues, and prevents redeposition and re-agglomeration of the dispersed residue during cleaning to afford superior cleaning and low defectivity. |
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Bibliography: | Application Number: EP20210878273 |