COMMUNICATION BETWEEN INTEGRATED CIRCUIT (1C) DIES IN WAFER- LEVEL FAN-OUT PACKAGE
Examples described herein generally relate to communication between integrated circuit (IC) dies in a wafer-level fan-out package. In an example, an electronic device includes a wafer-level fan-out package. The wafer-level fan-out package includes a first integrated circuit (IC) die, a second IC die...
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Main Authors | , , |
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Format | Patent |
Language | English French German |
Published |
09.08.2023
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Subjects | |
Online Access | Get full text |
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Summary: | Examples described herein generally relate to communication between integrated circuit (IC) dies in a wafer-level fan-out package. In an example, an electronic device includes a wafer-level fan-out package. The wafer-level fan-out package includes a first integrated circuit (IC) die, a second IC die, and a redistribution structure. The first IC die includes a transmitter circuit. The second IC die includes a receiver circuit. The redistribution structure includes physical channels electrically connected to and between the transmitter circuit and the receiver circuit. The transmitter circuit is configured to transmit multiple single-ended data signals and a differential clock signal through the physical channels to the receiver circuit. The receiver circuit is configured to capture data from the multiple single-ended data signals using a first single-ended clock signal based on the differential clock signal. |
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Bibliography: | Application Number: EP20210755855 |