ULTRASONIC TESTING WITH SINGLE SHOT PROCESSING

Examples of the present subject matter provide techniques for measuring thicknesses of materials using one or more acquisition cycles. The data from the one or more acquisition cycles may be amplified using a specified gain across the signal response, converted to a digital signal, and stored in a m...

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Bibliographic Details
Main Author THOMAS, Andrew
Format Patent
LanguageEnglish
French
German
Published 12.06.2024
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:Examples of the present subject matter provide techniques for measuring thicknesses of materials using one or more acquisition cycles. The data from the one or more acquisition cycles may be amplified using a specified gain across the signal response, converted to a digital signal, and stored in a memory. The digital signal may be retrieved from memory, and signal processing techniques using one or more time-variable threshold(s) may be used to calculate one or more thickness(es) of the testing object.
Bibliography:Application Number: EP20210845825