IMPROVEMENTS IN OR RELATING TO AN APPARATUS FOR DETECTION AND ANALYSIS OF A COMPONENT

An apparatus for creating and correcting a two dimensional intensity map of one or more assay spots in a detection zone is provided. The apparatus comprising, a locator for affirming the location of the detection zone; a total internal reflection excitation device comprising a light source for illum...

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Bibliographic Details
Main Authors KLUG, David R, DORRESTIJN, Marko, WORKUM, Stefan Leo Van, TUREK, Vladimir
Format Patent
LanguageEnglish
French
German
Published 17.05.2023
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An apparatus for creating and correcting a two dimensional intensity map of one or more assay spots in a detection zone is provided. The apparatus comprising, a locator for affirming the location of the detection zone; a total internal reflection excitation device comprising a light source for illuminating the one or more assay spots in the detection zone; a detector configured to receive light that is emitted, reflected or scattered from the one or more assay spots and to create a two dimensional intensity map of the one or more assay spots comprising a two dimensional array of quantitative pixel values; and a processor configured to correct the intensity map to remove noise through analysis of corresponding pixel values from an earlier intensity map; wherein the analysis includes curve fitting.
Bibliography:Application Number: EP20210746120