METHOD FOR SELECTION OF RAMAN EXCITATION WAVELENGTHS IN MULTI-SOURCE RAMAN PROBE

This invention relates to the field of spectroscopy and more particularly to a compact Raman spectroscopy system and method for providing enhanced quantitative analysis for process con-trol. The invention further relates to a Raman probe device for use in a Raman spectroscopy system. The method comp...

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Bibliographic Details
Main Authors CHARACHE, Greg W, RUDDER, Scott L
Format Patent
LanguageEnglish
French
German
Published 08.02.2023
Subjects
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:This invention relates to the field of spectroscopy and more particularly to a compact Raman spectroscopy system and method for providing enhanced quantitative analysis for process con-trol. The invention further relates to a Raman probe device for use in a Raman spectroscopy system. The method comprises the steps of : selecting a first excitation wavelength based on at least one characteristic of a target object; determining a range of a first Raman signal associated with said first excitation wavelength; determining a peak quantum efficiency value within the determined range of a quantum efficiency curve associated with said spectrometer; determining a Raman shifted peak of in-terest for the target object; and determining a second excita-tion wavelength based on the peak quantum efficiency value and the Raman shifted peak of interest.
Bibliography:Application Number: EP20210717987