CERTAIN IMPROVEMENTS OF MULTI-BEAM GENERATING AND MULTI-BEAM DEFLECTING UNITS

Certain improvements of multi-beam raster units such as multi-beam generating units and multi-beam deflector units of a multi-beam charged particle microscopes are provided. The improvements include design, fabrication and adjustment of multi-beam raster units including apertures of specific shape a...

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Main Authors RIEDESEL, Christof, KURIJ, Georg, FRITZ, Hans, ZEIDLER, Dirk, LENKE, Ralf, MAJOR, András, G, SAROV, Yanko, BIHR, Ulrich
Format Patent
LanguageEnglish
French
German
Published 18.01.2023
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Abstract Certain improvements of multi-beam raster units such as multi-beam generating units and multi-beam deflector units of a multi-beam charged particle microscopes are provided. The improvements include design, fabrication and adjustment of multi-beam raster units including apertures of specific shape and dimensions. The improvements can enable multi-beam generation and multi-beam deflection or stigmation with higher precision. The improvements can be relevant for routine applications of multi-beam charged particle microscopes, for example in semiconductor inspection and review, where high reliability and high reproducibility and low machine-to-machine deviations are desirable.
AbstractList Certain improvements of multi-beam raster units such as multi-beam generating units and multi-beam deflector units of a multi-beam charged particle microscopes are provided. The improvements include design, fabrication and adjustment of multi-beam raster units including apertures of specific shape and dimensions. The improvements can enable multi-beam generation and multi-beam deflection or stigmation with higher precision. The improvements can be relevant for routine applications of multi-beam charged particle microscopes, for example in semiconductor inspection and review, where high reliability and high reproducibility and low machine-to-machine deviations are desirable.
Author ZEIDLER, Dirk
LENKE, Ralf
RIEDESEL, Christof
FRITZ, Hans
KURIJ, Georg
MAJOR, András, G
BIHR, Ulrich
SAROV, Yanko
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– fullname: MAJOR, András, G
– fullname: SAROV, Yanko
– fullname: BIHR, Ulrich
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DocumentTitleAlternate CERTAINES AMÉLIORATIONS APPORTÉES À DES UNITÉS DE GÉNÉRATION ET DE DÉVIATION DE FAISCEAUX MULTIPLES
BESTIMMTE VERBESSERUNGEN VON MEHRSTRAHLERZEUGUNGS- UND MEHRSTRAHLABLENKEINHEITEN
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Snippet Certain improvements of multi-beam raster units such as multi-beam generating units and multi-beam deflector units of a multi-beam charged particle microscopes...
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ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
Title CERTAIN IMPROVEMENTS OF MULTI-BEAM GENERATING AND MULTI-BEAM DEFLECTING UNITS
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