SCANNING ELEMENT AND INDUCTIVE POSITION MEASURING DEVICE WITH THE SAME

A scanning element includes a circuit board having a first detector unit provided with a first receiver conductor trace arranged circumferentially about an axis in the circumferential direction. The course of the first receiver conductor trace has: a periodic configuration along a first line; a firs...

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Bibliographic Details
Main Authors HEINEMANN, Christoph, HEUMANN, Martin
Format Patent
LanguageEnglish
French
German
Published 15.03.2023
Subjects
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
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Summary:A scanning element includes a circuit board having a first detector unit provided with a first receiver conductor trace arranged circumferentially about an axis in the circumferential direction. The course of the first receiver conductor trace has: a periodic configuration along a first line; a first gap along its extension in the circumferential direction; a first amplitude in the first quadrant or in the second quadrant of a Cartesian coordinate system; and a second amplitude in the third quadrant or in the fourth quadrant of the coordinate system. The origin of the coordinate system is located on the axis, and the ordinate extends centrically through the first gap in relation to the circumferential direction. The second amplitude is smaller than the first amplitude.
Bibliography:Application Number: EP20200212347