PANEL RETARDANCE MEASUREMENT

• Main Authors: SCHUCK, Miller Harry III, AREND, Erik Heath, SISSOM, Bradley Jay, HALL, Heidi Leising, MACIAS ROMERO, Carlos Alberto, ZAGOLLA, Volker
• Format: Patent
• Language: English; French; German
• Published: 27.12.2023
• Subjects: DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL ANALOGUE/DIGITAL CONVERTERS; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS; OPTICAL LOGIC ELEMENTS; OPTICS; PHYSICS; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF

A method for determining a residual retardance of an LCOS (Liquid Crystal on Silicon) panel includes transmitting a light beam to the LCOS panel at an angle of incidence and measuring an intensity of a reflected light beam. The method includes biasing the LCOS panel in a dark state and measuring a dark state intensity of the reflected light beam. The method also includes biasing the LCOS panel in a bright state, and measuring a bright state intensity of the reflected light beam. A residual retardance of the LCOS panel is determined based on a contrast ratio of the bright state intensity and the dark state intensity. The method can also include selecting a compensator for the LCOS panel based on the residual retardance.