ADHERED SUBSTANCE COLLECTION DEVICE AND ADHERED SUBSTANCE ANALYSIS SYSTEM

• Main Authors: NOJIRI, Tatsuo, NAGANO, Hisashi, TAKADA, Yasuaki, MIZUNO, Hiroki, FUJII, Takayuki, KUMANO, Shun
• Format: Patent
• Language: English; French; German
• Published: 18.10.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

In order to stably collect an attached substance attached to an inspection object, a nozzle (111) configured to jet gas upward, an upper surface (105) equipped with an opening portion through which the gas is jetted, a collection opening through which the gas jetted toward an inspection object (C) is collected, and a contact detection sensor (130) configured to detect whether or not the inspection object (C) has come into contact with the upper surface (105) are included, an attached substance attached to the inspection object(C) is collected by using the gas, a height of a distal end of the nozzle (111) is substantially equal to a height of the upper surface (105); or equal to or less than a height of the upper surface (105), the upper surface (105) includes a recess portion (121), and, relative to a jet opening (112) of the nozzle (111), the recess portion (121) is closer to the collection opening, and is in contact with the jet opening (112) of the nozzle (111) or includes the jet opening (112) of the nozzle (111).