TESTING METHOD FOR NON-INVASIVE TEMPERATURE MEASURING INSTRUMENTS

A method for testing a temperature measuring instrument (1), wherein said instrument (1) comprises at least one sensor (2a-2c) that changes its electrical resistance R, and/or an electrical voltage U that it produces, in response to being exposed to a change in temperature T, and wherein the instrum...

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Bibliographic Details
Main Authors GEBHARDT, Jörg, DAAKE, Wilhelm, UDE, Peter, DECKER, Andreas, HORSTKOTTE, Jürgen
Format Patent
LanguageEnglish
French
German
Published 30.03.2022
Subjects
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Summary:A method for testing a temperature measuring instrument (1), wherein said instrument (1) comprises at least one sensor (2a-2c) that changes its electrical resistance R, and/or an electrical voltage U that it produces, in response to being exposed to a change in temperature T, and wherein the instrument (1) is configured to be coupled to an object of interest (3), the method comprising:* changing (110) the temperature T of at least one sensor (2a-2c) by an amount that is detectable given the measurement resolution dT of the at least one sensor (2a-2c), by driving an electrical manipulation current IM through this sensor (2a-2c);* obtaining (120) one or measurement values (4) from at least one sensor (2a-2c); and* evaluating (130) a state (5a) of the measuring instrument (1), a state (5b) of one or more of its sensors (2a-2c), and/or a state (5c) of a coupling to an object of interest (3), from the one or more measurement values (4).
Bibliography:Application Number: EP20200724869