METHOD FOR DENOISING AN ELECTRON MICROSCOPE IMAGE

The invention relates generally to image processing. In particular, the invention relates to a method and a device for denoising an electron microscope (EM) image. The method comprises the step of selecting a patch of the EM image, wherein the patch comprises a plurality of pixels, wherein the follo...

Full description

Saved in:
Bibliographic Details
Main Authors BLANCO, Victor M, DEY, Bappaditya, KAR, Gouri Sankar, VADAKUPUDHU PALAYAM, Senthil Srinivasan Shanmugam, HALDER, Sandip
Format Patent
LanguageEnglish
French
German
Published 16.03.2022
Subjects
Online AccessGet full text

Cover

Loading…