METHOD FOR DENOISING AN ELECTRON MICROSCOPE IMAGE

The invention relates generally to image processing. In particular, the invention relates to a method and a device for denoising an electron microscope (EM) image. The method comprises the step of selecting a patch of the EM image, wherein the patch comprises a plurality of pixels, wherein the follo...

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Bibliographic Details
Main Authors BLANCO, Victor M, DEY, Bappaditya, KAR, Gouri Sankar, VADAKUPUDHU PALAYAM, Senthil Srinivasan Shanmugam, HALDER, Sandip
Format Patent
LanguageEnglish
French
German
Published 16.03.2022
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Summary:The invention relates generally to image processing. In particular, the invention relates to a method and a device for denoising an electron microscope (EM) image. The method comprises the step of selecting a patch of the EM image, wherein the patch comprises a plurality of pixels, wherein the following steps are performed on the patch:i) replacing the value of one pixel, preferably of a center pixel, of the patch with the value of a different, preferably randomly selected, pixel from the same EM image;ii) determining a denoised value for the one pixel based on the values of the other pixels in the patch; andiii) replacing the value of the one pixel with the determined denoised value.
Bibliography:Application Number: EP20200195447