TUNGSTEN OXIDE SPUTTERING TARGET
A W18O49 peak is confirmed by X-ray diffraction analysis of a sputtering surface and a cross section orthogonal to the sputtering surface, a ratio IS(103)/IS(010) of a diffraction intensity IS(103) of a (103) plane to a diffraction intensity IS(010) of a (010) plane of W18O49 of the sputtering surfa...
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Main Authors | , , , |
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Format | Patent |
Language | English French German |
Published |
16.11.2022
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Subjects | |
Online Access | Get full text |
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