DIRECT IONIZATION IN IMAGING MASS SPECTROMETRY

As described herein, one or more parameters of a direct ionization imaging mass spectrometer (IMS) may be set to obtain a desired plasma and deliver it to a mass detector. Depending on the application, certain parameters may be predetermined (e.g., a spot size given a desired resolution) and, as des...

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Bibliographic Details
Main Authors SANDKUIJL, Daaf, CAREW, Adam, LOBODA, Alexander
Format Patent
LanguageEnglish
French
German
Published 12.10.2022
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
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Summary:As described herein, one or more parameters of a direct ionization imaging mass spectrometer (IMS) may be set to obtain a desired plasma and deliver it to a mass detector. Depending on the application, certain parameters may be predetermined (e.g., a spot size given a desired resolution) and, as described herein, other parameters can be adjusted to obtain the desired plasma properties. Also included is sample preparation suitable for direct ionization IMS and/or other imaging modalities.
Bibliography:Application Number: EP20200741427