APPARATUSES, SYSTEMS, AND METHODS FOR SAMPLE TESTING

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one...

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Bibliographic Details
Main Authors LUST, Lisa M, SHAFAI, Moin, BURNETT, Jennifer, KESTER, Robert Timothy, VENKATARAYALU, Suresh, MCGRAW, William, LOPAC, James A, PUCKETT, Matthew Wade, HEPPNER, Benjamin P, FENG, Chen, ISELLA, Giorgio Carlo, SALIT, Mary Katherine
Format Patent
LanguageEnglish
French
German
Published 10.11.2021
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.
Bibliography:Application Number: EP20210172749