SYSTEM AND METHODS FOR X-RAY IMAGING AND A CONTRAST AGENT
An x-ray apparatus and method can improve x-ray imaging in a variety of ways. For example, the improve x-ray apparatus can reduce scatter from x-ray images acquired by two-dimensional detectors. An improved 2D x-ray apparatus can provide 3D imaging for medical and/or industrial applications. An impr...
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Main Author | |
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Format | Patent |
Language | English French German |
Published |
09.06.2021
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Subjects | |
Online Access | Get full text |
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Summary: | An x-ray apparatus and method can improve x-ray imaging in a variety of ways. For example, the improve x-ray apparatus can reduce scatter from x-ray images acquired by two-dimensional detectors. An improved 2D x-ray apparatus can provide 3D imaging for medical and/or industrial applications. An improved 2D x-ray apparatus and method can produce separate material imaging, and composition analysis for characterization and correlation of image, densitometry, and composition information of individual component or individual material within a single subject. Non-rotational 3D microscopy, combining 2D or 3D full field x-ray imaging and high resolution 2D or 3D x-ray microscopy or spectral absorptiometry and spectroscopy can achieve a higher resolution and wider field of view in x-ray imaging and quantitative analysis in 3D and real time. The x-ray apparatus can improve tracking and/or surgical guidance in time and/or space. |
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Bibliography: | Application Number: EP20190755735 |