AUTOMATED ANALYSIS DEVICE

• Main Authors: ARUGA Youichi, INAGI Dai, YOKOTSUKA Satoshi, ABOUELSOUD Mohamed, HIRABAYASHI Yuichi
• Format: Patent
• Language: English; French; German
• Published: 17.02.2021
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention is directed to an automatic analyzer which is easier to investigate when some troubles such as data abnormality occurs in a sample analysis result as compared with an automatic analyzer according to the related art.The automatic analyzer includes: analysis units (8, 9, and 16) that perform analysis and quality control analysis for ensuring quality of the analysis; a storage medium (1a) that stores quality control results of the quality control analysis performed by the analysis units (8, 9, and 16); a monitor (2) that displays the quality control results; and a control PC (1) that controls an operation of the analysis units (8, 9, and 16), executes, when an arbitrary result is selected from the quality control results stored in the storage medium (1a), based on the selected quality control result, statistical calculation of the selected result and a quality control result performed in the past, and causes the monitor (2) to display a statistical calculation screen (300) as a statistical calculation result.