DEVICE FOR TESTING AN INTEGRATED CIRCUIT WITH OPTOELECTRONIC EMITTER, MANUFACTURING SYSTEM AND ASSOCIATED TESTING AND MANUFACTURING PROCESS

A checking device for an integrated circuit having an optoelectronic emitter defining an axis of emission of a beam of electromagnetic radiation comprising electrical connecting means for connecting the optoelectronic emitter to a source of electrical energy, reflecting means (13) suitable for being...

Full description

Saved in:
Bibliographic Details
Main Authors BLANCO NIETO, Patricia, DOMÍNGUEZ ÁLVAREZ, Noemí, CASTILLA GONZÁLEZ, Pau, SÁNCHEZ MARTÍNEZ, Jorge Julián, PIZARRO BONDIA, Carles
Format Patent
LanguageEnglish
French
German
Published 15.02.2023
Subjects
BASIC ELECTRIC ELEMENTS
COLORIMETRY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
SEMICONDUCTOR DEVICES
TESTING
Online AccessGet full text

Cover

More Information
Summary:A checking device for an integrated circuit having an optoelectronic emitter defining an axis of emission of a beam of electromagnetic radiation comprising electrical connecting means for connecting the optoelectronic emitter to a source of electrical energy, reflecting means (13) suitable for being positioned around the optoelectronic emitter, a convergent lens (17) the optical axis of which coincides with the axis of emission, an opaque sheet (18) having a plurality of holes, and a measuring module (4) suitable for receiving the electromagnetic radiation coming from the convergent lens (17). The device may be included in a manufacturing plant and perform a checking process in which there is performed an evaluation of some real values indicative of the amount of electromagnetic radiation emitted by said optoelectronic emitter depending on the direction and it is compared with some ranges of pre-set reference values.
Bibliography:Application Number: EP20180382831