PARTICLE BEAM MONITORING SYSTEMS AND METHODS

Presented systems and methods facilitate efficient and effective monitoring of particle beams. In some embodiments, a system comprises a primary particle beam generator that generates a primary particle beam, and a monitoring component that monitors the primary particle beam. The monitoring componen...

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Bibliographic Details
Main Author HEESE, Juergen
Format Patent
LanguageEnglish
French
German
Published 27.05.2020
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Summary:Presented systems and methods facilitate efficient and effective monitoring of particle beams. In some embodiments, a system comprises a primary particle beam generator that generates a primary particle beam, and a monitoring component that monitors the primary particle beam. The monitoring component comprises: a reaction component that is impacted by the primary particle beam, wherein results of an impact include creation of secondary photons; a detection component that detects a characteristic of the secondary photons; and a primary particle beam characteristic determination component that determines a characteristic of the primary particle beam based upon the characteristic of the secondary photons. The characteristic of the primary particle beam can include a radiation dose measurement and dose rate. The reaction component can include a foil component. A resolution time of less than a nano second can be associated with detecting the secondary photon characteristic.
Bibliography:Application Number: EP20180755713