METHOD FOR DETERMINING THE THERMAL DONOR CONCENTRATION OF A SEMICONDUCTOR SAMPLE
The invention relates to a method for determining the thermal donor concentration ([TD]test) of a test sample made of a semiconductor material. The method comprises the following steps:- providing (S11) a reference sample made of the same semiconductor material and having a known thermal donor conce...
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Main Authors | , , , , , , |
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Format | Patent |
Language | English French German |
Published |
02.11.2022
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Subjects | |
Online Access | Get full text |
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