FUNCTIONAL MODULE AND MICROSCOPE EQUIPPED WITH THE SAME

The invention concerns a functional module (02) for a microscope. That functional module (02) comprises a mechanical interface (11) for removable mounting the functional module (02) to a module support of the microscope. The functional module (02) further comprises an optical interface (12) for esta...

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Bibliographic Details
Main Authors GAIDUK, Alexander, SOHN, Jin Young, SEO, Cheong Soo, LIPPERT, Helmut, CHO, Gyoungil
Format Patent
LanguageEnglish
French
German
Published 08.05.2024
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Summary:The invention concerns a functional module (02) for a microscope. That functional module (02) comprises a mechanical interface (11) for removable mounting the functional module (02) to a module support of the microscope. The functional module (02) further comprises an optical interface (12) for establishing an optical path (09) from an objective (03) of the microscope to the functional module (02). Furthermore, the functional module (02) comprises at least one image sensor (21). According to the invention, the functional module (02) comprises a first microelectromechanical optical system (17) and a second microelectromechanical optical system (18). The first microelectromechanical optical system (17) is configured for enhancing a depth of field on a first optical subpath (14) that is directed to the image sensor (21). The second microelectromechanical optical system (18) is configured for enhancing a depth of field on a second optical subpath (16) that is directed to the image sensor (21). The present invention further concerns a microscope that comprises the functional module (02).
Bibliography:Application Number: EP20170202113