MULTI PROBE MEASUREMENT DEVICE, MEASURING SYSTEM AND METHOD

The present invention provides a multi probe measurement device (101, 201, 301) for measuring signals with multiple measurement probes (102, 103, 202, 203, 302, 303), the multi probe measurement device (101, 201, 301) comprising at least two probe interfaces (105, 106, 205, 206, 305, 306) each confi...

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Bibliographic Details
Main Authors REICH, Friedrich, BRESSER, Gerd
Format Patent
LanguageEnglish
French
German
Published 17.04.2019
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention provides a multi probe measurement device (101, 201, 301) for measuring signals with multiple measurement probes (102, 103, 202, 203, 302, 303), the multi probe measurement device (101, 201, 301) comprising at least two probe interfaces (105, 106, 205, 206, 305, 306) each configured to couple the multi probe measurement device (101, 201, 301) with at least one of the measurement probes (102, 103, 202, 203, 302, 303), a data interface (104, 204, 304) configured to couple the multi probe measurement device (101, 201, 301) to a measurement data receiver (110, 210, 310), and a processing unit (107, 207, 307) coupled to the at least two probe interfaces (105, 106, 205, 206, 305, 306) and configured to record measurement values (108, 208, 308) via the at least two probe interfaces (105, 106, 205, 206, 305, 306) from the measurement probes (102, 103, 202, 203, 302, 303), wherein the processing unit (107, 207, 307) is further coupled to the data interface (104, 204, 304) and configured to provide the recorded measurement values (108, 208, 308) to the measurement data receiver (110, 210, 310). Further, the present invention provides a respective measuring system (100, 200, 300) and a respective method.
Bibliography:Application Number: EP20170196106