SPARKLE MEASUREMENT

A device for radiometrically gauging the surface of a measurement object (O) includes: at least one measurement array featuring an illumination array and a pick-up array; and a processor (P) for controlling the illumination array and the pick-up array and for processing measurement signals produced...

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Bibliographic Details
Main Authors NIEDERER, Guido, EHBETS, Peter
Format Patent
LanguageEnglish
French
German
Published 22.04.2020
Subjects
CALCULATING
COLORIMETRY
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:A device for radiometrically gauging the surface of a measurement object (O) includes: at least one measurement array featuring an illumination array and a pick-up array; and a processor (P) for controlling the illumination array and the pick-up array and for processing measurement signals produced by the pick-up array and for providing processed image data. The illumination array exposes a region of the measurement object (O) to illumination light at an illumination angle (θi) and an illumination aperture angle (αi), and the pick-up array captures measurement light, reflected by the measurement object (O), at a pick-up angle (θv) and a pick-up aperture angle (αv) and guides it onto an image sensor exhibiting a pixel structure. The measurement object (O) is gauged multispectrally in multiple wavelength ranges, wherein the image sensor produces multispectral image data. Angular and spatial conditions are indicated which optimize the measurement device (MD) with regard to characterizing sparkles.
Bibliography:Application Number: EP20180208933